esp-hal/hil-test/tests/lcd_cam_i8080_async.rs
Dániel Buga 848029b152
Test all feature sets (#2901)
* Mark interconnect as unstable

* Explicitly set unstable feature in HIL tests

* WIP append feature set name to artifact

* Add name to feature sets, build all combinations

* Fix tests

* Provide a looping executor for stable async tests

* Fix usb serial jtag

* Hide interconnect types
2025-01-09 13:58:14 +00:00

71 lines
1.7 KiB
Rust

//! lcd_cam i8080 tests
//% CHIPS: esp32s3
//% FEATURES: unstable generic-queue
#![no_std]
#![no_main]
use esp_hal::{
dma::{DmaChannel0, DmaTxBuf},
dma_buffers,
gpio::NoPin,
lcd_cam::{
lcd::i8080::{Command, Config, TxEightBits, I8080},
LcdCam,
},
time::RateExtU32,
Async,
};
use hil_test as _;
const DATA_SIZE: usize = 1024 * 10;
struct Context<'d> {
lcd_cam: LcdCam<'d, Async>,
dma: DmaChannel0,
dma_buf: DmaTxBuf,
}
#[cfg(test)]
#[embedded_test::tests(default_timeout = 3, executor = hil_test::Executor::new())]
mod tests {
use super::*;
#[init]
async fn init() -> Context<'static> {
let peripherals = esp_hal::init(esp_hal::Config::default());
let lcd_cam = LcdCam::new(peripherals.LCD_CAM).into_async();
let (_, _, tx_buffer, tx_descriptors) = dma_buffers!(0, DATA_SIZE);
let dma_buf = DmaTxBuf::new(tx_descriptors, tx_buffer).unwrap();
Context {
lcd_cam,
dma: peripherals.DMA_CH0,
dma_buf,
}
}
#[test]
async fn test_i8080_8bit(ctx: Context<'static>) {
let pins = TxEightBits::new(NoPin, NoPin, NoPin, NoPin, NoPin, NoPin, NoPin, NoPin);
let i8080 = I8080::new(ctx.lcd_cam.lcd, ctx.dma, pins, {
let mut config = Config::default();
config.frequency = 20.MHz();
config
})
.unwrap();
let mut transfer = i8080.send(Command::<u8>::None, 0, ctx.dma_buf).unwrap();
transfer.wait_for_done().await;
// This should not block forever and should immediately return.
transfer.wait_for_done().await;
transfer.wait().0.unwrap();
}
}