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* HIL(QOL): Add missing timeouts to various tests * Increase timeouts for ECC * Use global timeout in hil tests * sha: increase test_digest_of_size_1_to_200 timeout from 10 to 15 seconds
59 lines
1.0 KiB
Rust
59 lines
1.0 KiB
Rust
//! Ensure invariants of locks are upheld.
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//% CHIPS: esp32 esp32c2 esp32c3 esp32c6 esp32h2 esp32s2 esp32s3
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// TODO: add multi-core tests
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#![no_std]
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#![no_main]
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use hil_test as _;
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#[cfg(test)]
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#[embedded_test::tests(default_timeout = 3)]
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mod tests {
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use esp_hal::sync::Locked;
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#[init]
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fn init() {
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esp_hal::init(esp_hal::Config::default());
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}
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#[test]
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fn critical_section_is_reentrant() {
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let mut flag = false;
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critical_section::with(|_| {
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critical_section::with(|_| {
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flag = true;
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});
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});
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assert!(flag);
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}
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#[test]
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fn locked_can_provide_mutable_access() {
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let flag = Locked::new(false);
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flag.with(|f| {
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*f = true;
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});
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flag.with(|f| {
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assert!(*f);
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});
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}
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#[test]
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#[should_panic]
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fn locked_is_not_reentrant() {
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let flag = Locked::new(false);
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flag.with(|_f| {
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flag.with(|f| {
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*f = true;
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});
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});
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}
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}
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