* Mark interconnect as unstable
* Explicitly set unstable feature in HIL tests
* WIP append feature set name to artifact
* Add name to feature sets, build all combinations
* Fix tests
* Provide a looping executor for stable async tests
* Fix usb serial jtag
* Hide interconnect types
* HIL(QOL): Add missing timeouts to various tests
* Increase timeouts for ECC
* Use global timeout in hil tests
* sha: increase test_digest_of_size_1_to_200 timeout from 10 to 15 seconds
* Add a derive procmacro to implement the Builder Lite pattern for a struct
* Add `#[non_exhaustive]` and derive `BuilderLite` where necessary in I2C module
* Add `#[non_exhaustive]` and derive `BuilderLite` where necessary in UART module
* Add `#[non_exhaustive]` and derive `BuilderLite` where necessary in SPI module
* Update `CHANGELOG.md`
* Fix build errors in HIL tests
* Fix generated doc comments
* Return a `ParseError` rather than panicking
* Add a method to set the value to `None` for `Option` types
* Remove hidden public SPI API
* Fix in_progress flags not being set
* Remove redundant checks, fix full-duplex flag
* Remove now-redundant Send impl
* apply_config
* SetConfig
* Return ConfigError
* Unwrap config result in ctor
* Remove configure_for_async
* Add into_async and into_blocking to I2c
* Add into_async and into_blocking to UsbSerialJtag
* Rework LCD_CAM
* Rmt
* RSA
* TWAI
* Uart
* Documentation
* Disable interrupts set on other core
* Move configure into RegisterAccess
* Disable interrupts on the other core
* Use EnumSet in RMT
* Drop State from DMA
* Simplify Error paths
* Cancel dropped transfers, fix and test
* Fix C6
* Avoid cancelling a completed transaction
* Do not implement DmaTxRxBuf for references
* Remove unnecessary import
* Merge BufferRef structs
* Move wait impl to the peripheral
* Allow the current byte to complete
* Restore SpiDmaTransfer::is_done
* Explain cancel code
* Fix test formatting
* Changelog
* Simplify implementation
* Make sure everything gets dropped
* Remove unnecessary PhantomData
* Remove OptionalFuture
* Adjust test to a more realistic clock frequency
* Print panic messages using semihosting
* Don't use defmt's asserts
* Make RA_OFFSET available without panic-handler
* Re-add defmt imports where missing
* Revert unintended test change
* Initialise hal in critical-section test
* Disable defmt in tests by default
* Re-enable tests
* Clean up
* Pass two lengths to configure_datalen
* Add Dominic's test changes
* Ensure DMA buffers are properly aligned
* Impl Format on DmaDescriptor
* Fix waiting for transaction to complete
* Fix DMA transfers
* Changelog
* Avoid explicit panic in test case
* Remove redundant test case
* Reintroduce wait for ESP32
* Allow accessing signal list via ErasedPin
* Replace AnyPin with more flexible signal config
* Update tests and examples
* Fix enable_from_gpio value
* Access signals from pin drivers
* DummyPin is not a pin
* Remove redundant public fns
* Various fixes, rename ErasedPin
* Changelog
* rustfmt
* Update i8080
* Typos and endless recursion
* Drop Pin suffix from traits
* Extract AF conversion
* Touch up changelog
* Clean up spi tests
* Refactor pull resistor handling
* Don't disable configured output functionality
* Clean up TODO
* Tweak docs
* Clean up examples
* i2c hil test
* pin
* fmt
* Test
* WIP (gpio test left)
* Finalize the CODE part (to be cleaned up)
fmt
* Smaller cleanup
* cleanup
* rebase
* fix
* getting last chips ready
* Addressing reviews
* Rework hal initialization
* Turn sw interrupt control into a virtual peripheral
* Return a tuple instead of a named struct
* Fix docs
* Remove SystemClockControl
* Move software interrupts under interrupt
* Re-document what's left in system
* Update time docs
* Update sw int docs
* Introduce Config
* Fix tests
* Remove redundant inits
* Doc
* Clean up examples&tests
* Update tests
* Add changelog entry
* Start migration guide
* Restore some convenience-imports
* Remove Config from prelude
* Convert `SoftwareInterrupt` to a unit struct
* Remove the `SystemExt` trait and rename `SystemParts` to `SystemControl`
* Update all examples an HIL tests to reflect previous API changes
* Clean up imports in `hil-test` package, address `clippy` lint warnings
* Update `CHANGELOG.md`
* Provide native APIs for SPI functionality currently handled by `embedded-hal` traits
* Provide APIs for I2C functionality currently handled by `embedded-hal` traits
* Rebase and update HIL test for SPI to get it building again
* Refactor testing, add defmt, add async gpio test
* Add test to ensure the some edge case pins can be used in async mode
* Add test for pin0
* clippy
* update test to use constants extracted from esp-idf's soc module
* address review comments
* simplify test to just initialize one pin as async
* changelog
